Zhe REN, Institute of High Energy Physics, Chinese Academy of Sciences.

Email: renzhe@ihep.ac.cn

Address: 19B Yuquan Road, Shijingshan District, Beijing, China

Postal code: 100049

Research Areas

My main research area is development and application of synchrotron-based X-ray diffraction techinques, such as micro-Laue diffraction, scanning X-ray diffraction map, coherent diffraction imaging, Bragg coherent diffraction imaging, and X-ray photon correlation spectroscopy.

Education

2012-10--2016-01   Aix-Marseille University, France, PhD
2009-10--2011-11   Ulm university, Germany, Master degree
2005-09--2009-07   Shandong University, China, Bachelor degree

Experience

   
Work Experience

2017-04--2019-10 Lund University, Sweden, Post-doc

2019-11--2023-07 DESY, Germany, Post-doc

2023-08 until now Chinese academy of sciences, intitute of high energy physics, Associate Professor


Publications

   
Papers
(1) Mapping the 3D position of battery cathode particles in Bragg coherent diffractive imaging, Journal of Synchrotron Radiation, 2023, 
(2) Unraveling the synergistic effects of Cu-Ag tandem catalysts during electrochemical CO 2 reduction using nanofocused X-ray probes, NATURE COMMUNICATIONS, 2023
(3) Strain mapping inside an individual processed vertical nanowire transistor using scanning X-ray nanodiffraction (vol 12, pg 14487, 2020), NANOSCALE, 2022
(4) Energy-dispersive X-ray micro Laue diffraction on a bent gold nanowire, JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2021,
(5) Morphogenesis of Magnetite Mesocrystals: Interplay between Nanoparticle Morphology and Solvation Shell, CHEMISTRY OF MATERIALS, 2021
(6) X-ray diffraction reveals the amount of strain and homogeneity of extremely bent single nanowires, JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2020
(7) First stages of plasticity in three-point bent Au nanowires detected by in situ Laue microdiffraction, APPLIED PHYSICS LETTERS, 2020,
(8) Few-cycle lightwave-driven currents in a semiconductor at high repetition rate, OPTICA, 2020
(9) GaN nanowires as probes for high resolution atomic force and scanning tunneling microscopy, REVIEW OF SCIENTIFIC INSTRUMENTS, 2019,
(10) In Situ Coherent X-ray Diffraction during Three-Point Bending of a Au Nanowire: Visualization and Quantification, QUANTUM BEAM SCIENCE, 2018
(11) Three-point bending behavior of a Au nanowire studied by in-situ Laue micro-diffraction, JOURNAL OF APPLIED PHYSICS, 2018,
(12) 3D Imaging of a Dislocation Loop at the Onset of Plasticity in an Indented Nanocrystal, NANO LETTERS, 2017,
(13) KB scanning of X-ray beam for Laue microdiffraction on accelero-phobic samples: application to in situ mechanically loaded nanowires, JOURNAL OF SYNCHROTRON RADIATION, 2016,
(14) In situ bending of an Au nanowire monitored by micro Laue diffraction, JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2015
(15) Scanning force microscope for in situ nanofocused X-ray diffraction studies, JOURNAL OF SYNCHROTRON RADIATION, 2014